ACCURACY, REPRODUCIBILITY AND SCOPE FOR X-RAY MICROANALYSIS WITH Si(Li) DETECTORS

ACCURACY, REPRODUCIBILITY AND SCOPE FOR X-RAY MICROANALYSIS WITH Si(Li) DETECTORS

The current state of the art for x-ray microanalysis is discussed with particular reference to accuracy and limits of detection, corrections for peak overlap and use of "windowless" detectors . It is now about ten years since reports appeared in the literature claiming that Si(Li) spectrometers (EDS) could be used for routine electron microprobe x-ray analysis giving results with accuracy compa...

Synthesis and characterization of Gd2O2 S: Tb3+ phosphor powder for X-ray imaging detectors

Gadolinium oxysulfide phosphor doped with trivalent terbium have been synthesized using urea homogenous precipitation and followed by sulfurization at 800 °C under argon atmosphere. Structural and morphological of synthesized phosphor powder were characterized by x-ray diffraction (XRD), scanning electron microscopy (SEM) and Fourier transform infrared spectrometry (FT-IR). Hexagonal structure ...

X-ray microanalysis attachment for electron microscope.

Fundamental Constants for Quantitative X-ray Microanalysis.

Quantitative X-ray microanalysis requires the use of many fundamental constants related to the interaction of the electron beam with the sample. The current state of our knowledge of such constants in the particular areas of electron stopping power, X-ray ionization cross-sections, X-ray fluorescence yield, and the electron backscattering yield, is examined. It is found that, in every case, the...

X-ray imaging detectors